Atomic force microscopy studies of surface and subsurface regions of silicone-based materials

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Original language	English
Pages (from-to)	554-555
Number of pages	2
Journal	American Chemical Society, Polymer Preprints, Division of Polymer Chemistry
Volume	39
Issue number	1
State	Published - Mar 1998

Cite this

@article{c6c5ee1e0caa4b50be927d8704b423f2,

title = "Atomic force microscopy studies of surface and subsurface regions of silicone-based materials",

author = "Tomasz Kowalewski and Steven Bullock and Pike, \{John D.\}",

year = "1998",

month = mar,

language = "English",

volume = "39",

pages = "554--555",

journal = "American Chemical Society, Polymer Preprints, Division of Polymer Chemistry",

issn = "0032-3934",

number = "1",

}

TY - JOUR

T1 - Atomic force microscopy studies of surface and subsurface regions of silicone-based materials

AU - Kowalewski, Tomasz

AU - Bullock, Steven

AU - Pike, John D.

PY - 1998/3

Y1 - 1998/3

UR - https://www.scopus.com/pages/publications/0032026792

M3 - Article

AN - SCOPUS:0032026792

SN - 0032-3934

VL - 39

SP - 554

EP - 555

JO - American Chemical Society, Polymer Preprints, Division of Polymer Chemistry

JF - American Chemical Society, Polymer Preprints, Division of Polymer Chemistry

IS - 1

ER -