@inproceedings{27608c9844f04f77932333de89e9cb0c,
title = "Atomic force microscopy beyond the standard quantum limit",
abstract = "We explore the impact of quantum noise reduction on force microscopy for broadband off-resonant materials characterization by integrating a multi-spatial-mode squeezed state as the readout field in a commercially available microscope.",
author = "Lawrie, \{B. J.\} and Pooser, \{R. C.\}",
note = "Publisher Copyright: {\textcopyright} OSA 2018.; CLEO: Applications and Technology, CLEO\_AT 2018 ; Conference date: 13-05-2018 Through 18-05-2018",
year = "2018",
doi = "10.1364/CLEO\_AT.2018.JF2B.3",
language = "English",
isbn = "9781943580422",
series = "Optics InfoBase Conference Papers",
publisher = "Optica Publishing Group (formerly OSA)",
booktitle = "CLEO",
}