@inproceedings{358b528d24294e34ac39de2e6be78fec,
title = "Atomic Force Microscopy beyond the Standard Quantum Limit",
abstract = "We explore the impact of quantum noise reduction on force microscopy for broadband off-resonant materials characterization by integrating a multi-spatial-mode squeezed state as the readout field in a commercially available microscope.",
author = "Lawrie, {B. J.} and Pooser, {R. C.}",
note = "Publisher Copyright: {\textcopyright} 2018 OSA.; 2018 Conference on Lasers and Electro-Optics, CLEO 2018 ; Conference date: 13-05-2018 Through 18-05-2018",
year = "2018",
month = aug,
day = "6",
language = "English",
isbn = "9781943580422",
series = "2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings",
}