Atomic force microscopy beyond the standard quantum limit

B. J. Lawrie; R. C. Pooser

doi:10.1364/CLEO_AT.2018.JF2B.3

Atomic force microscopy beyond the standard quantum limit

B. J. Lawrie, R. C. Pooser

Quantum Heterostructures

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We explore the impact of quantum noise reduction on force microscopy for broadband off-resonant materials characterization by integrating a multi-spatial-mode squeezed state as the readout field in a commercially available microscope.

Original language	English
Title of host publication	CLEO
Subtitle of host publication	Applications and Technology, CLEO_AT 2018
Publisher	Optica Publishing Group (formerly OSA)
ISBN (Print)	9781943580422
DOIs	https://doi.org/10.1364/CLEO_AT.2018.JF2B.3
State	Published - 2018
Event	CLEO: Applications and Technology, CLEO_AT 2018 - San Jose, United States Duration: May 13 2018 → May 18 2018

Publication series

Name	Optics InfoBase Conference Papers
Volume	Part F92-CLEO_AT 2018
ISSN (Electronic)	2162-2701

Conference

Conference	CLEO: Applications and Technology, CLEO_AT 2018
Country/Territory	United States
City	San Jose
Period	05/13/18 → 05/18/18

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10.1364/CLEO_AT.2018.JF2B.3

Cite this

@inproceedings{27608c9844f04f77932333de89e9cb0c,

title = "Atomic force microscopy beyond the standard quantum limit",

abstract = "We explore the impact of quantum noise reduction on force microscopy for broadband off-resonant materials characterization by integrating a multi-spatial-mode squeezed state as the readout field in a commercially available microscope.",

author = "Lawrie, {B. J.} and Pooser, {R. C.}",

note = "Publisher Copyright: {\textcopyright} OSA 2018.; CLEO: Applications and Technology, CLEO_AT 2018 ; Conference date: 13-05-2018 Through 18-05-2018",

year = "2018",

doi = "10.1364/CLEO_AT.2018.JF2B.3",

language = "English",

isbn = "9781943580422",

series = "Optics InfoBase Conference Papers",

publisher = "Optica Publishing Group (formerly OSA)",

booktitle = "CLEO",

}

Lawrie, BJ & Pooser, RC 2018, Atomic force microscopy beyond the standard quantum limit. in CLEO: Applications and Technology, CLEO_AT 2018. Optics InfoBase Conference Papers, vol. Part F92-CLEO_AT 2018, Optica Publishing Group (formerly OSA), CLEO: Applications and Technology, CLEO_AT 2018, San Jose, United States, 05/13/18. https://doi.org/10.1364/CLEO_AT.2018.JF2B.3

TY - GEN

T1 - Atomic force microscopy beyond the standard quantum limit

AU - Lawrie, B. J.

AU - Pooser, R. C.

PY - 2018

Y1 - 2018

N2 - We explore the impact of quantum noise reduction on force microscopy for broadband off-resonant materials characterization by integrating a multi-spatial-mode squeezed state as the readout field in a commercially available microscope.

AB - We explore the impact of quantum noise reduction on force microscopy for broadband off-resonant materials characterization by integrating a multi-spatial-mode squeezed state as the readout field in a commercially available microscope.

UR - http://www.scopus.com/inward/record.url?scp=85049139844&partnerID=8YFLogxK

U2 - 10.1364/CLEO_AT.2018.JF2B.3

DO - 10.1364/CLEO_AT.2018.JF2B.3

M3 - Conference contribution

AN - SCOPUS:85049139844

SN - 9781943580422

T3 - Optics InfoBase Conference Papers

BT - CLEO

PB - Optica Publishing Group (formerly OSA)

T2 - CLEO: Applications and Technology, CLEO_AT 2018

Y2 - 13 May 2018 through 18 May 2018

ER -

Atomic force microscopy beyond the standard quantum limit

Abstract

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