Original language | English |
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Pages (from-to) | 1094-1095 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 10 |
Issue number | SUPPL. 2 |
DOIs | |
State | Published - 2004 |
Atomic Force Microscopy (AFM) imaging and force recognition at the molecular level in bacteria
D. P. Allison, C. J. Sullivan, J. L. Morrell, P. R. Hoyt, M. J. Doktycz
Research output: Contribution to journal › Article › peer-review