Assessment of Techniques for Characterizing the Surface Quality of Ground Silicon Nitride

E. S. Zanoria, T. R. Watkins, K. Breder, L. Riester, M. Bashkansky, J. Reintjes, J. G. Sun, W. A. Ellingson, P. J. Blau

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

This study evaluates techniques used to detect and quantify the extent of surface and subsurface damage in ground silicon nitride. Specimens of two differently ground surfaces of a hot isostatically pressed (HIP) silicon nitride, commercially designated as GS-44, were subjected to six types of analyses, namely mechanical stylus profiling, atomic force microscopy, point-counting analysis of fragmentation pits, laser-light scattering, optical gating, and grazing incidence x-ray diffraction (GIXD). The results of these investigations are compared and discussed. The techniques providing the clearest correlations with grinding conditions were mechanical stylus roughness, fragmentation analysis, and GIXD (residual stress conditions). Those that exhibited some correlation but appear to require more work to develop a reliable evaluation method were laser scattering and optical gating. Atomic force microscopy was useful, but not as a routine investigative tool for quality control in ceramic machining. The techniques that appear to have the most near-term potential for routine use are fragmentation analysis and optical gating. Laser-based optical scattering exhibits potential for routine application, but, more development is needed for its commercialization.

Original languageEnglish
Pages (from-to)533-547
Number of pages15
JournalJournal of Materials Engineering and Performance
Volume7
Issue number4
DOIs
StatePublished - Aug 1998
Externally publishedYes

Funding

The authors acknowledge the support of the U.S. Department of Energy, Assistant Secretary for Energy Efficiency and Renewable Energy, Office of Transportation Technologies, as part of the Propulsion System Materials Program, under contract DE-AC05-96OR22464 with Lockheed Martin Energy Research Corp. In addition, this research was supported in part by an appointment of E.S. Zanoria to the Oak Ridge National Laboratory Postdoctoral Research Associates Program administered jointly by Oak Ridge National Laboratory (ORNL) and the Oak Ridge Institute for Science and Education (ORISE). Grinding and cutting of the GS-44 billets into test coupons were performed by the ORNL Machining and Inspection Research Group.

Keywords

  • Grinding
  • Silicon nitride
  • Surface characterization
  • Surface wear

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