TY - GEN
T1 - ASIC for small angle neutron scattering experiments at the SNS
AU - De Geronimo, Gianluigi
AU - Fried, Jack
AU - Smith, Graham C.
AU - Yu, Bo
AU - Vernon, Emerson
AU - Britton, Charles L.
AU - Bryan, William L.
AU - Clonts, Lloyd G.
AU - Frank, Shane S.
PY - 2006
Y1 - 2006
N2 - We present an ASIC for a 3He gas detector to be used in small angle neutron scattering experiments at the Spallation Neutron Source in Oak Ridge. The ASIC is composed of 64 channels with low noise charge amplification, filtering, timing and amplitude measurement circuits, where an innovative current-mode peak-detector and digitizer (PDAD) is adopted. The proposed PDAD provides at the same time peak detection and A/D conversion in real time, at low power, and without requiring a clock signal. The channels share an efficient data sparsification and derandomization scheme, a 30-bit 256 deep FIFO, and low voltage differential signaling.
AB - We present an ASIC for a 3He gas detector to be used in small angle neutron scattering experiments at the Spallation Neutron Source in Oak Ridge. The ASIC is composed of 64 channels with low noise charge amplification, filtering, timing and amplitude measurement circuits, where an innovative current-mode peak-detector and digitizer (PDAD) is adopted. The proposed PDAD provides at the same time peak detection and A/D conversion in real time, at low power, and without requiring a clock signal. The channels share an efficient data sparsification and derandomization scheme, a 30-bit 256 deep FIFO, and low voltage differential signaling.
UR - http://www.scopus.com/inward/record.url?scp=38649108850&partnerID=8YFLogxK
U2 - 10.1109/NSSMIC.2006.355980
DO - 10.1109/NSSMIC.2006.355980
M3 - Conference contribution
AN - SCOPUS:38649108850
SN - 1424405610
SN - 9781424405619
T3 - IEEE Nuclear Science Symposium Conference Record
SP - 834
EP - 840
BT - 2006 IEEE Nuclear Science Symposium - Conference Record
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2006 IEEE Nuclear Science Symposium, Medical Imaging Conference and 15th International Workshop on Room-Temperature Semiconductor X- and Gamma-Ray Detectors, Special Focus Workshops, NSS/MIC/RTSD
Y2 - 29 October 2006 through 4 November 2006
ER -