Artifact-free sample preparation of metal thin films using Xe plasma-focused ion beam milling for atomic resolution and in situ biasing analyses

  • Hee Beom Lee
  • , Seon Je Kim
  • , Min Hyoung Jung
  • , Young Hoon Kim
  • , Su Jae Kim
  • , Hai Feng Gao
  • , Brandon Van Leer
  • , Se Young Jeong
  • , Hu Young Jeong
  • , Young Min Kim

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

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