Artifact-free sample preparation of metal thin films using Xe plasma-focused ion beam milling for atomic resolution and in situ biasing analyses

Hee Beom Lee, Seon Je Kim, Min Hyoung Jung, Young Hoon Kim, Su Jae Kim, Hai Feng Gao, Brandon Van Leer, Se Young Jeong, Hu Young Jeong, Young Min Kim

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

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