Abstract
Heteroepitaxy of semiconductors on two-dimensional (2-d) atomic layered materials enables the use of flexible and transferable inorganic electronic and optoelectronic devices in various applications. Herein, we report the shape- and morphology-controlled van der Waals (vdW) epitaxy of ZnO nanostructures on hexagonal boron nitride (hBN) insulating layers for an architectured semiconductor integration on the 2-d layered materials. The vdW surface feature of the 2-d nanomaterials, because of the surface free of dangling bonds, typically results in low-density random nucleation-growth in the vdW epitaxy. The difficulty in controlling the nucleation sites was resolved by artificially formed atomic ledges prepared on hBN substrates, which promoted the preferential vdW nucleation-growth of ZnO specifically along the designed ledges. Electron microscopy revealed crystallographically domain-aligned incommensurate vdW heteroepitaxial relationships, even though ZnO/hBN is highly latticemismatched. First-principles theoretical calculations confirmed the weakly bound, noncovalent binding feature of the ZnO/hBN heterostructure. Electrical characterizations of the ZnO nanowall networks grown on hBN revealed the excellent electrical insulation properties of hBN substrates. An ultraviolet photoconductor device using the vdW epitaxial ZnO nanowall networks/ hBN heterostructure was further demonstrated as an example of hBN substrate-based device applications. The architectured heteroepitaxy of semiconductors on hBN is thus expected to create many other device arrays that can be integrated on a piece of substrate with good electrical insulation for use in individual device operation.
Original language | English |
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Pages (from-to) | e145 |
Journal | NPG Asia Materials |
Volume | 6 |
Issue number | 12 |
DOIs | |
State | Published - Jan 1 2014 |
Externally published | Yes |
Funding
This work was financially supported by the Future-based Technology Development Program (Nano Fields) through the National Research Foundation (NRF) of Korea that is funded by the Ministry of Education, Science and Technology (MEST) (No. 2010-0029325), as well as partially supported by the NSFC-NRF Scientific Cooperation Program, NRF Grant (NRF-2012K1A2B1A03000327). The work by YJH was supported by the Basic Science Research Program through the NRF funded by MEST (No. NRF-2013R1A1A2058744) and the Priority Research Centers Program (2010-0020207) through the NRF funded by MEST. The work by MK, SY and K-SK was supported by the NRF grant funded by the Ministry of Science, ICT and Future Planning (MSIP) (NRF 2013034238 & NRF 2013050169). Y-KK and S-HK gratefully acknowledge financial support from the Korean government (MSIP) through the NRF (NRF-2011-0016188), the Ministry of Trade, Industry & Energy (MOTIE) (Project No. 10045360) and the Korea Semiconductor Research Consortium (KSRC) through the project of developing source technology for future semiconductor devices.
Funders | Funder number |
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NSFC-NRF Scientific Cooperation Program | NRF-2012K1A2B1A03000327, NRF-2013R1A1A2058744, 2010-0020207 |
Ministry of Trade, Industry and Energy | 10045360 |
Ministry of Science, ICT and Future Planning | NRF 2013050169, 2013034238, NRF-2011-0016188 |
National Research Foundation of Korea | |
Ministry of Education, Science and Technology | 2010-0029325 |
Korea Semiconductor Research Consortium |