TY - JOUR
T1 - Architecture of a silicon strip beam position monitor
AU - Angstadt, R.
AU - Cooper, W.
AU - Demarteau, M.
AU - Green, J.
AU - Jakubowski, S.
AU - Prosser, A.
AU - Rivera, R.
AU - Turqueti, M.
AU - Utes, M.
AU - Cai, X.
PY - 2010/12
Y1 - 2010/12
N2 - A collaboration between Fermilab and the Institute for High Energy Physics (IHEP), Beijing, has developed a beam position monitor for the IHEP test beam facility. This telescope is based on 5 stations of silicon strip detectors having a pitch of 60 microns. The total active area of each layer of the detector is about 12×10 cm2. Readout of the strips is provided through the use of VA1' ASICs mounted on custom hybrid printed circuit boards and interfaced to Adapter Cards via copper-over-kapton flexible circuits. The Adapter Cards amplify and level-shift the signal for input to the Fermilab CAPTAN data acquisition nodes for data readout and channel configuration. These nodes deliver readout of triggered events and temperature data to an analysis computer over gigabit Ethernet links.
AB - A collaboration between Fermilab and the Institute for High Energy Physics (IHEP), Beijing, has developed a beam position monitor for the IHEP test beam facility. This telescope is based on 5 stations of silicon strip detectors having a pitch of 60 microns. The total active area of each layer of the detector is about 12×10 cm2. Readout of the strips is provided through the use of VA1' ASICs mounted on custom hybrid printed circuit boards and interfaced to Adapter Cards via copper-over-kapton flexible circuits. The Adapter Cards amplify and level-shift the signal for input to the Fermilab CAPTAN data acquisition nodes for data readout and channel configuration. These nodes deliver readout of triggered events and temperature data to an analysis computer over gigabit Ethernet links.
KW - Analogue electronic circuits
KW - Beam-intensity monitors
KW - Beam-line instrumentation (beam position and profile monitors
KW - Bunch length monitors)
KW - Data acquisition circuits
KW - Front-end electronics for detector readout
UR - https://www.scopus.com/pages/publications/78751536266
U2 - 10.1088/1748-0221/5/12/C12039
DO - 10.1088/1748-0221/5/12/C12039
M3 - Article
AN - SCOPUS:78751536266
SN - 1748-0221
VL - 5
JO - Journal of Instrumentation
JF - Journal of Instrumentation
IS - 12
M1 - C12039
ER -