APT mass spectrometry and SEM data for CdTe solar cells

Jonathan D. Poplawsky, Chen Li, Naba R. Paudel, Wei Guo, Yanfa Yan, Stephen J. Pennycook

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

Atom probe tomography (APT) data acquired from a CAMECA LEAP 4000 XHR for the CdS/CdTe interface for a non-CdCl2 treated CdTe solar cell as well as the mass spectrum of an APT data set including a GB in a CdCl2-treated CdTe solar cell are presented. Scanning electron microscopy (SEM) data showing the evolution of sample preparation for APT and scanning transmission electron microscopy (STEM) electron beam induced current (EBIC) are also presented. These data show mass spectrometry peak decomposition of Cu and Te within an APT dataset, the CdS/CdTe interface of an untreated CdTe solar cell, preparation of APT needles from the CdS/CdTe interface in superstrate grown CdTe solar cells, and the preparation of a cross-sectional STEM EBIC sample.

Original languageEnglish
Pages (from-to)779-785
Number of pages7
JournalData in Brief
Volume7
DOIs
StatePublished - Jun 1 2016

Funding

This research was supported by the US Department of Energy (DOE) Office of Energy Efficiency and Renewable Energy , Foundational Program to Advance Cell Efficiency (F-PACE) , grant number DE-FOA-0000492 , and by ORNL׳s Center for Nanophase Materials Sciences (CNMS) , which is a DOE Office of Science User Facility. J.P. was supported in part by ORNL’s laboratory directed research and development (LDRD) program.

FundersFunder number
CNMS
DOE Office of Science
F-PACEDE-FOA-0000492
ORNL׳s Center for Nanophase Materials Sciences
US Department of Energy
U.S. Department of Energy
Office of Energy Efficiency and Renewable Energy
Oak Ridge National Laboratory
Laboratory Directed Research and Development
Horizon 2020 Framework Programme656378

    Keywords

    • Atom probe tomography
    • Mass spectroscopy
    • Scanning electron microscopy
    • Solar cells

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