Applications of high-resolution aberration-corrected STEM imaging to studies of the behavior of nanophase materials at elevated temperatures

Lawrence F. Allard; Karren L. More; Jimmy Liu

doi:10.1017/S143192760909895X

Applications of high-resolution aberration-corrected STEM imaging to studies of the behavior of nanophase materials at elevated temperatures

Lawrence F. Allard, Karren L. More, Jimmy Liu

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

Original language	English
Pages (from-to)	130-131
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	15
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S143192760909895X
State	Published - Jul 2009

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@article{6ac2c1d54487493a940edfc24791d98b,

title = "Applications of high-resolution aberration-corrected STEM imaging to studies of the behavior of nanophase materials at elevated temperatures",

author = "Allard, \{Lawrence F.\} and More, \{Karren L.\} and Jimmy Liu",

year = "2009",

month = jul,

doi = "10.1017/S143192760909895X",

language = "English",

volume = "15",

pages = "130--131",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "SUPPL. 2",

}

TY - JOUR

T1 - Applications of high-resolution aberration-corrected STEM imaging to studies of the behavior of nanophase materials at elevated temperatures

AU - Allard, Lawrence F.

AU - More, Karren L.

AU - Liu, Jimmy

PY - 2009/7

Y1 - 2009/7

UR - https://www.scopus.com/pages/publications/69949136464

U2 - 10.1017/S143192760909895X

DO - 10.1017/S143192760909895X

M3 - Article

AN - SCOPUS:69949136464

SN - 1431-9276

VL - 15

SP - 130

EP - 131

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Applications of high-resolution aberration-corrected STEM imaging to studies of the behavior of nanophase materials at elevated temperatures

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