Original language | English |
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Pages (from-to) | 130-131 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 15 |
Issue number | SUPPL. 2 |
DOIs | |
State | Published - Jul 2009 |
Applications of high-resolution aberration-corrected STEM imaging to studies of the behavior of nanophase materials at elevated temperatures
Lawrence F. Allard, Karren L. More, Jimmy Liu
Research output: Contribution to journal › Article › peer-review
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