Applications of Doppler-free saturation spectroscopy for edge physics studies (invited)

E. H. Martin; A. Zafar; J. B.O. Caughman; R. C. Isler; G. L. Bell

doi:10.1063/1.4961287

Applications of Doppler-free saturation spectroscopy for edge physics studies (invited)

E. H. Martin, A. Zafar, J. B.O. Caughman, R. C. Isler, G. L. Bell

Research output: Contribution to journal › Article › peer-review

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Abstract

Doppler-free saturation spectroscopy provides a very powerful method to obtain detailed information about the electronic structure of the atom through measurement of the spectral line profile. This is achieved through a significant decrease in the Doppler broadening and essentially an elimination of the instrument broadening inherent to passive spectroscopic techniques. In this paper we present the technique and associated physics of Doppler-free saturation spectroscopy in addition to how one selects the appropriate transition. Simulations of H_δ spectra are presented to illustrate the increased sensitivity to both electric field and electron density measurements.

Original language	English
Article number	11E402
Journal	Review of Scientific Instruments
Volume	87
Issue number	11
DOIs	https://doi.org/10.1063/1.4961287
State	Published - Nov 1 2016

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@article{6ee881b0500846b9b29d473331316438,

title = "Applications of Doppler-free saturation spectroscopy for edge physics studies (invited)",

abstract = "Doppler-free saturation spectroscopy provides a very powerful method to obtain detailed information about the electronic structure of the atom through measurement of the spectral line profile. This is achieved through a significant decrease in the Doppler broadening and essentially an elimination of the instrument broadening inherent to passive spectroscopic techniques. In this paper we present the technique and associated physics of Doppler-free saturation spectroscopy in addition to how one selects the appropriate transition. Simulations of Hδ spectra are presented to illustrate the increased sensitivity to both electric field and electron density measurements.",

author = "Martin, {E. H.} and A. Zafar and Caughman, {J. B.O.} and Isler, {R. C.} and Bell, {G. L.}",

note = "Publisher Copyright: {\textcopyright} 2016 Author(s).",

year = "2016",

month = nov,

day = "1",

doi = "10.1063/1.4961287",

language = "English",

volume = "87",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

publisher = "American Institute of Physics",

number = "11",

}

TY - JOUR

T1 - Applications of Doppler-free saturation spectroscopy for edge physics studies (invited)

AU - Martin, E. H.

AU - Zafar, A.

AU - Caughman, J. B.O.

AU - Isler, R. C.

AU - Bell, G. L.

PY - 2016/11/1

Y1 - 2016/11/1

N2 - Doppler-free saturation spectroscopy provides a very powerful method to obtain detailed information about the electronic structure of the atom through measurement of the spectral line profile. This is achieved through a significant decrease in the Doppler broadening and essentially an elimination of the instrument broadening inherent to passive spectroscopic techniques. In this paper we present the technique and associated physics of Doppler-free saturation spectroscopy in addition to how one selects the appropriate transition. Simulations of Hδ spectra are presented to illustrate the increased sensitivity to both electric field and electron density measurements.

AB - Doppler-free saturation spectroscopy provides a very powerful method to obtain detailed information about the electronic structure of the atom through measurement of the spectral line profile. This is achieved through a significant decrease in the Doppler broadening and essentially an elimination of the instrument broadening inherent to passive spectroscopic techniques. In this paper we present the technique and associated physics of Doppler-free saturation spectroscopy in addition to how one selects the appropriate transition. Simulations of Hδ spectra are presented to illustrate the increased sensitivity to both electric field and electron density measurements.

UR - http://www.scopus.com/inward/record.url?scp=84984691740&partnerID=8YFLogxK

U2 - 10.1063/1.4961287

DO - 10.1063/1.4961287

M3 - Article

AN - SCOPUS:84984691740

SN - 0034-6748

VL - 87

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 11

M1 - 11E402

ER -

Applications of Doppler-free saturation spectroscopy for edge physics studies (invited)

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