Applications of atomic scale scanning transmission electron microscopy

N. D. Browning, R. Erni, C. J. Mitterbauer, L. Fu, M. Chi, S. Mehraeen, M. Herrera, H. T. Chou, H. Stahlberg, Q. M. Ramasse, A. Ziegler, G. Nicotra, I. Arslan, J. C. Idrobo, E. A. Stach, A. Bleloch

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)134-135
Number of pages2
JournalMicroscopy and Microanalysis
Volume12
Issue numberSUPPL. 2
DOIs
StatePublished - Aug 2006
Externally publishedYes

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