Application of various XAFS techniques to the investigation of structurally damaged materials

R. B. Greegor, F. W. Lytle, B. C. Chakoumakos, R. C. Ewing, R. J. Livak, F. W. Clinard, E. D. Crozier, N. Alberding, A. J. Seary, G. W. Arnold, M. J. Weber, J. Wong, W. J. Wever

Research output: Contribution to journalArticlepeer-review

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Abstract

We have applied several XAFS techniques to study materials which have been structurally modified in a variety of ways. These techniques include conventional absorption and fluorescence methods as well as electron yield at atmospheric pressure, grazing incidence and optical EXAFS. The method used depended upon the sample to be investigated and the information desired. The various samples examined and the approaches used are discussed for natural metamict minerals, Pu doped zirconolite, 50/200 KeV Pb implanted SrTiO3 and Mn containing glass.

Original languageEnglish
Pages (from-to)498-500
Number of pages3
JournalPhysica B: Physics of Condensed Matter
Volume158
Issue number1-3
DOIs
StatePublished - Jun 1989

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