TY - GEN
T1 - Application of thermoelastic lamination theory to predict warpage of a symmetric and simply supported printed wiring board during temperature cycling
AU - Polsky, Y.
AU - Ume, C.
AU - Sutherlin, W.
N1 - Publisher Copyright:
© 1998 IEEE.
PY - 1998
Y1 - 1998
N2 - The applicability of classical laminated plate theory to the prediction of thermally induced warpage of a printed wiring board is examined in this study. A bare, four-layer printed wiring board without traces has been constructed. The temperature-dependent mechanical properties of the board core materials have been measured. Closed form solutions of the differential equations of equilibrium for the classical lamination theory description of the board are obtained to predict warpage. The model accounts for material property change with temperature, the board's support conditions, and thermal gradients through the board thickness to assess the role of each in the warpage process. The warpage results predicted by the model are then compared to those obtained experimentally, using the shadow-moire technique in a simulated infrared reflow environment, to assess the model's accuracy.
AB - The applicability of classical laminated plate theory to the prediction of thermally induced warpage of a printed wiring board is examined in this study. A bare, four-layer printed wiring board without traces has been constructed. The temperature-dependent mechanical properties of the board core materials have been measured. Closed form solutions of the differential equations of equilibrium for the classical lamination theory description of the board are obtained to predict warpage. The model accounts for material property change with temperature, the board's support conditions, and thermal gradients through the board thickness to assess the role of each in the warpage process. The warpage results predicted by the model are then compared to those obtained experimentally, using the shadow-moire technique in a simulated infrared reflow environment, to assess the model's accuracy.
UR - http://www.scopus.com/inward/record.url?scp=0031625756&partnerID=8YFLogxK
U2 - 10.1109/ECTC.1998.678717
DO - 10.1109/ECTC.1998.678717
M3 - Conference contribution
AN - SCOPUS:0031625756
SN - 0780345266
T3 - Proceedings - Electronic Components and Technology Conference
SP - 345
EP - 352
BT - 1998 Proceedings - 48th Electronic Components and Technology Conference, ECTC 1998
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 48th Electronic Components and Technology Conference, ECTC 1998
Y2 - 25 May 1998 through 28 May 1998
ER -