Application of STEM characterization for investigating radiation effects in BCC Fe-based alloys

Chad M. Parish, Kevin G. Field, Alicia G. Certain, Janelle P. Wharry

Research output: Contribution to journalReview articlepeer-review

97 Scopus citations

Abstract

This paper provides an overview of advanced scanning transmission electron microscopy (STEM) techniques used for characterization of irradiated BCC Fe-based alloys. Advanced STEM methods provide the high-resolution imaging and chemical analysis necessary to understand the irradiation response of BCC Fe-based alloys. The use of STEM with energy dispersive x-ray spectroscopy (EDX) for measurement of radiation-induced segregation (RIS) is described, with an illustrated example of RIS in proton- and self-ion irradiated T91. Aberration-corrected STEM-EDX for nanocluster/nanoparticle imaging and chemical analysis is also discussed, and examples are provided from ion-irradiated oxide dispersion strengthened (ODS) alloys. Finally, STEM techniques for void, cavity, and dislocation loop imaging are described, with examples from various BCC Fe-based alloys.

Original languageEnglish
Pages (from-to)1275-1289
Number of pages15
JournalJournal of Materials Research
Volume30
Issue number9
DOIs
StatePublished - Jan 27 2015

Funding

FundersFunder number
National Science Foundation
U.S. Department of Energy

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