Application of an improved mathematical model to the analysis of cross-sectional EBIC of GaN-based LEDs

C. M. Parish, C. L. Progl, A. D. Batchelor, P. E. Russell

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	752-753
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	12
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927606066475
State	Published - Aug 2006
Externally published	Yes

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title = "Application of an improved mathematical model to the analysis of cross-sectional EBIC of GaN-based LEDs",

author = "Parish, \{C. M.\} and Progl, \{C. L.\} and Batchelor, \{A. D.\} and Russell, \{P. E.\}",

year = "2006",

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T1 - Application of an improved mathematical model to the analysis of cross-sectional EBIC of GaN-based LEDs

AU - Parish, C. M.

AU - Progl, C. L.

AU - Batchelor, A. D.

AU - Russell, P. E.

PY - 2006/8

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UR - https://www.scopus.com/pages/publications/33750871117

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DO - 10.1017/S1431927606066475

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SN - 1431-9276

VL - 12

SP - 752

EP - 753

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

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