Application of an improved mathematical model to the analysis of cross-sectional EBIC of GaN-based LEDs

C. M. Parish, C. L. Progl, A. D. Batchelor, P. E. Russell

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	752-753
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	12
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927606066475
State	Published - Aug 2006
Externally published	Yes

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title = "Application of an improved mathematical model to the analysis of cross-sectional EBIC of GaN-based LEDs",

author = "Parish, {C. M.} and Progl, {C. L.} and Batchelor, {A. D.} and Russell, {P. E.}",

year = "2006",

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doi = "10.1017/S1431927606066475",

language = "English",

volume = "12",

pages = "752--753",

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AU - Parish, C. M.

AU - Progl, C. L.

AU - Batchelor, A. D.

AU - Russell, P. E.

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SP - 752

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JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

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