Antisite defects in layered multiferroic CuCr0.9In0.1P2S6

Qian He; Alex Belianinov; Andrius Dziaugys; Petro Maksymovych; Yulian Vysochanskii; Sergei V. Kalinin; Albina Y. Borisevich

doi:10.1039/c5nr04779j

Antisite defects in layered multiferroic CuCr_0.9In_0.1P₂S₆

Qian He, Alex Belianinov, Andrius Dziaugys, Petro Maksymovych, Yulian Vysochanskii, Sergei V. Kalinin, Albina Y. Borisevich

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10 Scopus citations

Abstract

The CuCr_1-xIn_xP₂S₆ system represents a large family of metal chalcogenophosphates that are unique and promising candidates for 2D materials with functionalities such as ferroelectricity. In this work, we carried out detailed microstructural and chemical characterization of these compounds using aberration-corrected STEM, in order to understand the origin of these different ordering phenomena. Quantitative STEM-HAADF imaging and analysis identified the stacking order of an 8-layer thin flake, which leads to the identification of anti-site In³⁺(Cu⁺) doping. We believe that these findings will pave the way towards understanding the ferroic coupling phenomena in van der Waals lamellar compounds, as well as their potential applications in 2-D electronics.

Original language	English
Pages (from-to)	18579-18583
Number of pages	5
Journal	Nanoscale
Volume	7
Issue number	44
DOIs	https://doi.org/10.1039/c5nr04779j
State	Published - Nov 28 2015

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title = "Antisite defects in layered multiferroic CuCr0.9In0.1P2S6 ",

abstract = "The CuCr1-xInxP2S6 system represents a large family of metal chalcogenophosphates that are unique and promising candidates for 2D materials with functionalities such as ferroelectricity. In this work, we carried out detailed microstructural and chemical characterization of these compounds using aberration-corrected STEM, in order to understand the origin of these different ordering phenomena. Quantitative STEM-HAADF imaging and analysis identified the stacking order of an 8-layer thin flake, which leads to the identification of anti-site In3+(Cu+) doping. We believe that these findings will pave the way towards understanding the ferroic coupling phenomena in van der Waals lamellar compounds, as well as their potential applications in 2-D electronics.",

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AU - He, Qian

AU - Belianinov, Alex

AU - Dziaugys, Andrius

AU - Maksymovych, Petro

AU - Vysochanskii, Yulian

AU - Kalinin, Sergei V.

AU - Borisevich, Albina Y.

PY - 2015/11/28

Y1 - 2015/11/28

N2 - The CuCr1-xInxP2S6 system represents a large family of metal chalcogenophosphates that are unique and promising candidates for 2D materials with functionalities such as ferroelectricity. In this work, we carried out detailed microstructural and chemical characterization of these compounds using aberration-corrected STEM, in order to understand the origin of these different ordering phenomena. Quantitative STEM-HAADF imaging and analysis identified the stacking order of an 8-layer thin flake, which leads to the identification of anti-site In3+(Cu+) doping. We believe that these findings will pave the way towards understanding the ferroic coupling phenomena in van der Waals lamellar compounds, as well as their potential applications in 2-D electronics.

AB - The CuCr1-xInxP2S6 system represents a large family of metal chalcogenophosphates that are unique and promising candidates for 2D materials with functionalities such as ferroelectricity. In this work, we carried out detailed microstructural and chemical characterization of these compounds using aberration-corrected STEM, in order to understand the origin of these different ordering phenomena. Quantitative STEM-HAADF imaging and analysis identified the stacking order of an 8-layer thin flake, which leads to the identification of anti-site In3+(Cu+) doping. We believe that these findings will pave the way towards understanding the ferroic coupling phenomena in van der Waals lamellar compounds, as well as their potential applications in 2-D electronics.

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Antisite defects in layered multiferroic CuCr_0.9In_0.1P₂S₆

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