Abstract
Epitaxially twinned (001)-, (118)-, and (104)-oriented La-substituted Bi4Ti3O12 (BLT) ferroelectric films have been grown by pulsed laser deposition on (001)-, (011)-, and (111)-oriented SrTiO3 single-crystal substrates, respectively, covered with SrRuO3. Well-defined (001)-oriented BLT films were grown at a substrate temperature as low as 600°C. By x-ray diffraction characterization it has been found that the low-index three-dimensional epitaxial orientation relationship BLT(001)SrRuO3(001)SrTiO3(001); BLT[11̄0]SrRuO3[100]SrTiO3[100] is valid for all epitaxially twinned BLT thin films grown on SrRuO3-covered SrTiO 3 substrates in spite of their different orientations. The (104)-oriented BLT films showed an about 1.5 times higher remanent polarization (2Pr=31.9μC/cm2) than the (118)-oriented BLT films (2Pr=20.7μC/cm2), while (001)-oriented BLT films revealed only a small polarization component (2Pr=1.1μC/cm 2), thus demonstrating the ferroelectric anisotropy.
Original language | English |
---|---|
Pages (from-to) | 1040-1042 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 80 |
Issue number | 6 |
DOIs | |
State | Published - Feb 11 2002 |
Externally published | Yes |