Anisotropic ferroelectric properties of epitaxially twinned Bi 3.25La0.75Ti3O12 thin films grown with three different orientations

Ho Nyung Lee, Dietrich Hesse

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Abstract

Epitaxially twinned (001)-, (118)-, and (104)-oriented La-substituted Bi4Ti3O12 (BLT) ferroelectric films have been grown by pulsed laser deposition on (001)-, (011)-, and (111)-oriented SrTiO3 single-crystal substrates, respectively, covered with SrRuO3. Well-defined (001)-oriented BLT films were grown at a substrate temperature as low as 600°C. By x-ray diffraction characterization it has been found that the low-index three-dimensional epitaxial orientation relationship BLT(001)SrRuO3(001)SrTiO3(001); BLT[11̄0]SrRuO3[100]SrTiO3[100] is valid for all epitaxially twinned BLT thin films grown on SrRuO3-covered SrTiO 3 substrates in spite of their different orientations. The (104)-oriented BLT films showed an about 1.5 times higher remanent polarization (2Pr=31.9μC/cm2) than the (118)-oriented BLT films (2Pr=20.7μC/cm2), while (001)-oriented BLT films revealed only a small polarization component (2Pr=1.1μC/cm 2), thus demonstrating the ferroelectric anisotropy.

Original languageEnglish
Pages (from-to)1040-1042
Number of pages3
JournalApplied Physics Letters
Volume80
Issue number6
DOIs
StatePublished - Feb 11 2002
Externally publishedYes

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