Analytical photon scanning tunneling microscopy

M. A. Paesler; P. J. Moyer; C. J. Jahncke; C. E. Johnson; R. C. Reddick; R. J. Warmack; T. L. Ferrell

doi:10.1103/PhysRevB.42.6750

Analytical photon scanning tunneling microscopy

M. A. Paesler, P. J. Moyer, C. J. Jahncke, C. E. Johnson, R. C. Reddick, R. J. Warmack, T. L. Ferrell

Sensors and Electronics

Research output: Contribution to journal › Article › peer-review

43 Scopus citations

Abstract

The photon scanning tunneling microscope (PSTM) has been operated in spectroscopic mode to both image the topography and analyze stress features on a microindented, chromium-implanted sapphire surface. Light originating primarily from the evanescent field generated by an internally reflected beam, with some contribution from scattering by roughness features and radiation from fluorescence and luminescence, was coupled into the probe tip. The topographic resolution observed (50 nm) is appreciably finer than the diffraction limit. Stresses of 3 kbar around microindents were measured by monitoring shifts in the photoluminescence peaks. A discussion of the spectroscopic resolution obtainable with this analytical PSTM and applications are presented.

Original language	English
Pages (from-to)	6750-6753
Number of pages	4
Journal	Physical Review B
Volume	42
Issue number	10
DOIs	https://doi.org/10.1103/PhysRevB.42.6750
State	Published - 1990

Access to Document

10.1103/PhysRevB.42.6750

Cite this

@article{39da25989f164a929452b129f8cfbbc0,

title = "Analytical photon scanning tunneling microscopy",

abstract = "The photon scanning tunneling microscope (PSTM) has been operated in spectroscopic mode to both image the topography and analyze stress features on a microindented, chromium-implanted sapphire surface. Light originating primarily from the evanescent field generated by an internally reflected beam, with some contribution from scattering by roughness features and radiation from fluorescence and luminescence, was coupled into the probe tip. The topographic resolution observed (50 nm) is appreciably finer than the diffraction limit. Stresses of 3 kbar around microindents were measured by monitoring shifts in the photoluminescence peaks. A discussion of the spectroscopic resolution obtainable with this analytical PSTM and applications are presented.",

author = "Paesler, {M. A.} and Moyer, {P. J.} and Jahncke, {C. J.} and Johnson, {C. E.} and Reddick, {R. C.} and Warmack, {R. J.} and Ferrell, {T. L.}",

year = "1990",

doi = "10.1103/PhysRevB.42.6750",

language = "English",

volume = "42",

pages = "6750--6753",

journal = "Physical Review B",

issn = "0163-1829",

publisher = "American Physical Society",

number = "10",

}

TY - JOUR

T1 - Analytical photon scanning tunneling microscopy

AU - Paesler, M. A.

AU - Moyer, P. J.

AU - Jahncke, C. J.

AU - Johnson, C. E.

AU - Reddick, R. C.

AU - Warmack, R. J.

AU - Ferrell, T. L.

PY - 1990

Y1 - 1990

N2 - The photon scanning tunneling microscope (PSTM) has been operated in spectroscopic mode to both image the topography and analyze stress features on a microindented, chromium-implanted sapphire surface. Light originating primarily from the evanescent field generated by an internally reflected beam, with some contribution from scattering by roughness features and radiation from fluorescence and luminescence, was coupled into the probe tip. The topographic resolution observed (50 nm) is appreciably finer than the diffraction limit. Stresses of 3 kbar around microindents were measured by monitoring shifts in the photoluminescence peaks. A discussion of the spectroscopic resolution obtainable with this analytical PSTM and applications are presented.

AB - The photon scanning tunneling microscope (PSTM) has been operated in spectroscopic mode to both image the topography and analyze stress features on a microindented, chromium-implanted sapphire surface. Light originating primarily from the evanescent field generated by an internally reflected beam, with some contribution from scattering by roughness features and radiation from fluorescence and luminescence, was coupled into the probe tip. The topographic resolution observed (50 nm) is appreciably finer than the diffraction limit. Stresses of 3 kbar around microindents were measured by monitoring shifts in the photoluminescence peaks. A discussion of the spectroscopic resolution obtainable with this analytical PSTM and applications are presented.

UR - http://www.scopus.com/inward/record.url?scp=0000005888&partnerID=8YFLogxK

U2 - 10.1103/PhysRevB.42.6750

DO - 10.1103/PhysRevB.42.6750

M3 - Article

AN - SCOPUS:0000005888

SN - 0163-1829

VL - 42

SP - 6750

EP - 6753

JO - Physical Review B

JF - Physical Review B

IS - 10

ER -

Analytical photon scanning tunneling microscopy

Abstract

Access to Document

Other files and links

Fingerprint

Cite this