Analytical modeling of residual stresses in multilayered superconductor systems

C. H. Hsueh; M. Paranthaman

doi:10.1007/s10853-008-2920-7

Analytical modeling of residual stresses in multilayered superconductor systems

C. H. Hsueh, M. Paranthaman

Nanomaterials Chemistry Group

Research output: Contribution to journal › Article › peer-review

37 Scopus citations

Abstract

Residual stresses-induced damages in multilayered films grown on technical substrates present a reliability issue for the fabrication and applications of multilayered superconductor systems. Using closed-form solutions for residual stresses in multilayered systems, specific results were calculated for residual stresses induced by the lattice and the thermal mismatches in the system of YBCO/CeO₂/YSZ/Y₂O₃ films on a Ni-5 W substrate. It was concluded that lattice mismatch-induced residual stresses must be relaxed by forming interfacial defects. Studies of residual thermal stresses showed the following. When the thickness of a film is negligible compared to the substrate, the changes of its properties modify the residual stresses in this film layer but have negligible effects on the residual stresses in other layers in the system. On the other hand, when the thickness of certain film layer is not negligible compared to the substrate, residual stresses in each layer can be controlled by adjusting the properties and thickness of this film layer. Finally, the effects of buffer layers on thermal stresses in YBa ₂Cu₃O_7-x (YBCO) were addressed by using YBCO/LaMnO₃/homo-epi MgO/IBAD MgO/Y₂O₃/Al ₂O₃ films on Hastelloy substrate as an example.

Original language	English
Pages (from-to)	6223-6232
Number of pages	10
Journal	Journal of Materials Science
Volume	43
Issue number	18
DOIs	https://doi.org/10.1007/s10853-008-2920-7
State	Published - Sep 2008

Funding

Acknowledgements The authors thank Dr. E. D. Specht and Dr. A. Shyam for reviewing the manuscript. This work was jointly sponsored by US Department of Energy, Office of Electricity Delivery and Energy Reliability—Superconductivity for Electric Systems Program and Office of Science, Office of Basic Energy Sciences, Division of Materials Science and Engineering under contract DE-AC05-00OR22725 with UT-Battelle, LLC.

Funders	Funder number
Division of Materials Science and Engineering	DE-AC05-00OR22725
Office of Basic Energy Sciences
US Department of Energy
Office of Science

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abstract = "Residual stresses-induced damages in multilayered films grown on technical substrates present a reliability issue for the fabrication and applications of multilayered superconductor systems. Using closed-form solutions for residual stresses in multilayered systems, specific results were calculated for residual stresses induced by the lattice and the thermal mismatches in the system of YBCO/CeO2/YSZ/Y2O3 films on a Ni-5 W substrate. It was concluded that lattice mismatch-induced residual stresses must be relaxed by forming interfacial defects. Studies of residual thermal stresses showed the following. When the thickness of a film is negligible compared to the substrate, the changes of its properties modify the residual stresses in this film layer but have negligible effects on the residual stresses in other layers in the system. On the other hand, when the thickness of certain film layer is not negligible compared to the substrate, residual stresses in each layer can be controlled by adjusting the properties and thickness of this film layer. Finally, the effects of buffer layers on thermal stresses in YBa 2Cu3O7-x (YBCO) were addressed by using YBCO/LaMnO3/homo-epi MgO/IBAD MgO/Y2O3/Al 2O3 films on Hastelloy substrate as an example.",

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AB - Residual stresses-induced damages in multilayered films grown on technical substrates present a reliability issue for the fabrication and applications of multilayered superconductor systems. Using closed-form solutions for residual stresses in multilayered systems, specific results were calculated for residual stresses induced by the lattice and the thermal mismatches in the system of YBCO/CeO2/YSZ/Y2O3 films on a Ni-5 W substrate. It was concluded that lattice mismatch-induced residual stresses must be relaxed by forming interfacial defects. Studies of residual thermal stresses showed the following. When the thickness of a film is negligible compared to the substrate, the changes of its properties modify the residual stresses in this film layer but have negligible effects on the residual stresses in other layers in the system. On the other hand, when the thickness of certain film layer is not negligible compared to the substrate, residual stresses in each layer can be controlled by adjusting the properties and thickness of this film layer. Finally, the effects of buffer layers on thermal stresses in YBa 2Cu3O7-x (YBCO) were addressed by using YBCO/LaMnO3/homo-epi MgO/IBAD MgO/Y2O3/Al 2O3 films on Hastelloy substrate as an example.

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Analytical modeling of residual stresses in multilayered superconductor systems

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