@inproceedings{acb547eb5562411f8db65142ad5be64b,
title = "Analytical electron microscopy examination of solid reaction products in long-term tests of SRL 200 waste glasses",
abstract = "This paper describes the use of analytical electron microscopy (AEM) to identify secondary phases that have formed during the reaction of 200-type glass. Phases were identified both on the leached layers of glass and as colloidal particles within the leachate. Because high-energy electrons interact strongly with matter, electron beam techniques provide a powerful means of characterizing phases that are less than a micron in diameter.",
author = "Buck, {E. C.} and Fortner, {J. A.} and Bates, {J. K.} and X. Feng and Dietz, {N. L.} and Bardley, {C. R.} and Tani, {B. S.}",
year = "1994",
language = "English",
isbn = "1558992324",
series = "Materials Research Society Symposium Proceedings",
publisher = "Publ by Materials Research Society",
pages = "585--593",
booktitle = "Scientific Basis for Nuclear Waste Management XVII",
note = "Proceedings of the 17th Materials Society Symposium ; Conference date: 29-11-1993 Through 03-12-1993",
}