Analytical beam propagation model for clipped focused-Gaussian beams using vector diffraction theory

Glen D. Gillen, Christopher M. Seck, Shekhar Guha

Research output: Contribution to journalArticlepeer-review

17 Scopus citations

Abstract

Vector diffraction theory is applied to the case of focused TEM 00 Gaussian beams passing through a spatially limiting aperture in order to investigate the propagation of these clipped focused-Gaussian beams. Beam distributions at different axial distances show that a traditional M 2 propagation model cannot be used for the propagation of clipped focus-Gaussian beams. Using Luneberg's vector diffraction theory and Fresnel approximations, an analytical model for the on-axis transverse and longitudinal electric fields and intensity distributions is presented including predictions of the maximum obtainable intensity. In addition, an analytical expression is provided for the longitudinal component of the electric field of a TEM 00 mode unperturbed Gaussian beam. Experimental results are also presented and compared to the model's predictions.

Original languageEnglish
Pages (from-to)4023-4040
Number of pages18
JournalOptics Express
Volume18
Issue number5
DOIs
StatePublished - Mar 1 2010
Externally publishedYes

Fingerprint

Dive into the research topics of 'Analytical beam propagation model for clipped focused-Gaussian beams using vector diffraction theory'. Together they form a unique fingerprint.

Cite this