Analysis of nano-scale strain near shallow trench isolation structures by energy-filtered convergent beam electron diffraction

  • Peng Zhang
  • , John Mardinly
  • , Oleh Karpenko
  • , Andrei Istratov
  • , Haifeng He
  • , Joel Ager
  • , Chris Nelson
  • , Eric Stach
  • , Christian Kisielowski
  • , Eicke Weber
  • , John Spence

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)938-939
Number of pages2
JournalMicroscopy and Microanalysis
Volume12
Issue numberSUPPL. 2
DOIs
StatePublished - Aug 2006
Externally publishedYes

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