Analysis of Low Signal-to-Noise Atomic Resolution Spectroscopy of Radiation-Induced Sublattice Disorder in Ferritic Superalloys

Thomas W. Pfeifer; Kan Ma; Nianhua Peng; Alexander Knowles; Jordan Hachtel; Eric R. Hoglund; Patrick E. Hopkins

doi:10.1093/mam/ozae044.655

Analysis of Low Signal-to-Noise Atomic Resolution Spectroscopy of Radiation-Induced Sublattice Disorder in Ferritic Superalloys

Thomas W. Pfeifer
, Kan Ma
, Nianhua Peng
, Alexander Knowles
, Jordan Hachtel
, Eric R. Hoglund
, Patrick E. Hopkins

electron Microscopy and Microanalysis

Research output: Contribution to journal › Conference article › peer-review

1 Scopus citations

Original language	English
Pages (from-to)	1326-1327
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	30
Issue number	2024
DOIs	https://doi.org/10.1093/mam/ozae044.655
State	Published - Jul 24 2024
Event	82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States Duration: Jul 28 2024 → Aug 1 2024

Funding

E.R.H. and J.A.H. acknowledge support from the U.S. Department of Energy, Office of Basic Energy Sciences (DOE-BES), Division of Materials Sciences and Engineering under contract ERKCS89.

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10.1093/mam/ozae044.655

Cite this

@article{e19a415949d94ea8a4c9841797e5f5d8,

title = "Analysis of Low Signal-to-Noise Atomic Resolution Spectroscopy of Radiation-Induced Sublattice Disorder in Ferritic Superalloys",

author = "Pfeifer, \{Thomas W.\} and Kan Ma and Nianhua Peng and Alexander Knowles and Jordan Hachtel and Hoglund, \{Eric R.\} and Hopkins, \{Patrick E.\}",

year = "2024",

month = jul,

day = "24",

doi = "10.1093/mam/ozae044.655",

language = "English",

volume = "30",

pages = "1326--1327",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "2024",

note = "82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 ; Conference date: 28-07-2024 Through 01-08-2024",

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TY - JOUR

T1 - Analysis of Low Signal-to-Noise Atomic Resolution Spectroscopy of Radiation-Induced Sublattice Disorder in Ferritic Superalloys

AU - Pfeifer, Thomas W.

AU - Ma, Kan

AU - Peng, Nianhua

AU - Knowles, Alexander

AU - Hachtel, Jordan

AU - Hoglund, Eric R.

AU - Hopkins, Patrick E.

PY - 2024/7/24

Y1 - 2024/7/24

UR - https://www.scopus.com/pages/publications/85215660599

U2 - 10.1093/mam/ozae044.655

DO - 10.1093/mam/ozae044.655

M3 - Conference article

AN - SCOPUS:85215660599

SN - 1431-9276

VL - 30

SP - 1326

EP - 1327

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 2024

T2 - 82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024

Y2 - 28 July 2024 through 1 August 2024

ER -

Analysis of Low Signal-to-Noise Atomic Resolution Spectroscopy of Radiation-Induced Sublattice Disorder in Ferritic Superalloys

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