Original language | English |
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Pages (from-to) | 1390-1391 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 14 |
Issue number | SUPPL. 2 |
DOIs | |
State | Published - Aug 2008 |
Analysis of catalysts using aberration-corrected TEM
Steven Rozeveld, Douglas A. Blom, Lawrence F. Allard, Timm Richardson, Clifford Todd, John H. Blackson
Research output: Contribution to journal › Article › peer-review