An integrated CMOS time interval measurement system with subnanosecond resolution for the WA-98 calorimeter

Michael L. Simpson, Charles L. Britton, Alan L. Wintenberg, Glenn R. Young

Research output: Contribution to journalArticlepeer-review

20 Scopus citations

Abstract

The time interval measurement system of the WA-98 calorimeter is presented. This system consists of a constant fraction discriminator (CFD), a variable delay circuit, a time-to-amplitude converter (TAC), and a Wilkinson analog-to-digital converter (ADC) all realized in a 1.2-μm N-well CMOS process. These circuits measured the time interval between a reference logic signal and a photomultiplier tube (PMT) signal that had amplitude variations of 100:1 and 10-ns rise and fall times. The system operated over the interval range from 2 us to 200 its with a resolution of ∼±300 ps including all walk and jitter components. The variable delay circuit allowed the CFD output to be delayed by up to 1 μs with jitter component of ∼0.04% of the delay setting. These circuits operated with a 5-V power supply. Although this application was in nuclear physics instrumentation, these circuits could also be useful in other scientific measurements, medical imaging, automatic test equipment, ranging systems, and industrial electronics.

Original languageEnglish
Pages (from-to)198-205
Number of pages8
JournalIEEE Journal of Solid-State Circuits
Volume32
Issue number2
DOIs
StatePublished - Feb 1997

Funding

Manuscript received February 16, 1996; revised July 26, 1996. This work was supported by the U.S. Department of Energy and performed at the Oak Ridge National Laboratory, managed by Lockheed Martin Energy Systems, Inc. for the U.S. Department of Energy under Contract DE-AC05-84OR21400. The authors are with the Oak Ridge National Laboratory, Oak Ridge, TN 37831-6006 USA. Publisher Item Identifier S 0018-9200(97)01129-3.

FundersFunder number
Lockheed Martin Energy Systems, Inc.DE-AC05-84OR21400
U.S. Department of Energy

    Keywords

    • Instrumentation
    • Nuclear electronics
    • Time measurements

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