An improved mode of operation of a transmission electron microscope for wide field off-axis holography

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    Abstract

    An improved mode of operation for low magnification off-axis electron holography is presented which permits a significant increase of the field of view over that obtained by the standard low magnification technique in a standard field emission transmission electron microscope. This improvement is achieved by a weak excitation of the objective lens. Ray diagrams for the different low magnification modes are discussed and verified on a Hitachi HF-2000 transmission electron microscope operated in free lens control mode.

    Original languageEnglish
    Pages (from-to)15-20
    Number of pages6
    JournalUltramicroscopy
    Volume63
    Issue number1
    DOIs
    StatePublished - Apr 1996

    Funding

    This work was supportedb y the Laboratory Directed R&D Program of Oak Ridge National Laboratory, managed for the DOE by Lockheed Martin Energy Research, under contract DE-ACOS-840R2 1400.

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