An improved mode of operation of a transmission electron microscope for wide field off-axis holography

B. G. Frost, E. Voelkl, L. F. Allard

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

An improved mode of operation for low magnification off-axis electron holography is presented which permits a significant increase of the field of view over that obtained by the standard low magnification technique in a standard field emission transmission electron microscope. This improvement is achieved by a weak excitation of the objective lens. Ray diagrams for the different low magnification modes are discussed and verified on a Hitachi HF-2000 transmission electron microscope operated in free lens control mode.

Original languageEnglish
Pages (from-to)15-20
Number of pages6
JournalUltramicroscopy
Volume63
Issue number1
DOIs
StatePublished - Apr 1996

Funding

This work was supportedb y the Laboratory Directed R&D Program of Oak Ridge National Laboratory, managed for the DOE by Lockheed Martin Energy Research, under contract DE-ACOS-840R2 1400.

FundersFunder number
U.S. Department of Energy
Lockheed MartinDE-ACOS-840R2 1400
Oak Ridge National Laboratory

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