Abstract
Compositionally complex alloys hold the promise of simultaneously attaining superior combinations of properties, such as corrosion resistance, light-weighting, and strength. Achieving this goal is a challenge due in part to a large number of possible compositions and structures in the vast alloy design space. High-throughput methods offer a path forward, but a strong connection between the synthesis of an alloy of a given composition and structure with its properties has not been fully realized to date. Here, we present the rapid identification of corrosion-resistant alloys based on combinations of Al and Cr in a base Al–Co–Cr–Fe–Ni alloy. Previously unstudied alloy stoichiometries were identified using a combination of high-throughput experimental screening coupled with key metallurgical and electrochemical corrosion tests, identifying alloys with excellent passivation behavior. The alloy native oxide performance and its self-healing attributes were probed using rapid tests in deaerated 0.1-mol/L H2SO4. Importantly, a correlation was found between the electrochemical impedance modulus of the exposure-modified air-formed film and self-healing rate of the CCAs. Multi-element extended x-ray absorption fine structure analyses connected more ordered type chemical short-range order in the Ni–Al 1st nearest-neighbor shell to poorer corrosion resistance. This report underscores the utility of high-throughput exploration of compositionally complex alloys for the identification and rapid screening of a vast stoichiometric space.
| Original language | English |
|---|---|
| Pages (from-to) | 336-353 |
| Number of pages | 18 |
| Journal | High Entropy Alloys and Materials |
| Volume | 1 |
| Issue number | 2 |
| DOIs | |
| State | Published - Sep 2023 |
Funding
The authors gratefully acknowledge partial funding from the Office of Naval Research (ONR) through the Multidisciplinary University Research Initiative (MURI) program (Award #: N00014-20-1-2368) with program manager Dr. Dave Shifler. D.S. was partially supported by the DMSE-UVA Olsen Graduate Fellowship for the duration of this work. E.F.H. was partially funded by the In-house Laboratory Independent Research (ILIR) program, Program Element 0601153N, managed by the NSWC Carderock Division Director of Research for the ONR. Further, the authors acknowledge the University of Virginia Nanoscale Materials Characterization Facility for the use of the PHI Versaprobe III XPS and SEM, the Eyring Materials Center at Arizona State University supported in part by NNCI-ECCS-1542160 for the WDS work, and the Johns Hopkins University Materials Characterization and Processing Center, in the Whiting School of Engineering for use of Focused Ion Beam and Transmission Electron Microscopy tools. The PHI VersaProbe III system was supported by NSF-MRI Award #162601, MRI Acquisition of an X-ray Photoelectron Spectrometer for Chemical Mapping of Evolving Surfaces: A Regional Instrument for Research and Teaching. Thanks also to Dan Gopman for dicing the wafers at the NIST Center for Nanoscale Science and Technology. This research used the NIST Beamline for Materials Measurement of the National Synchrotron Light Source II, a U.S. Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Brookhaven National Laboratory under Contract No. DE-SC0012704. We thank Bruce Ravel for assistance in collecting the EXAFS data. The authors gratefully acknowledge partial funding from the Office of Naval Research (ONR) through the Multidisciplinary University Research Initiative (MURI) program (Award #: N00014-20-1-2368) with program manager Dr. Dave Shifler. D.S. was partially supported by the DMSE-UVA Olsen Graduate Fellowship for the duration of this work. E.F.H. was partially funded by the In-house Laboratory Independent Research (ILIR) program, Program Element 0601153N, managed by the NSWC Carderock Division Director of Research for the ONR. Further, the authors acknowledge the University of Virginia Nanoscale Materials Characterization Facility for the use of the PHI Versaprobe III XPS and SEM, the Eyring Materials Center at Arizona State University supported in part by NNCI-ECCS-1542160 for the WDS work, and the Johns Hopkins University Materials Characterization and Processing Center, in the Whiting School of Engineering for use of Focused Ion Beam and Transmission Electron Microscopy tools. The PHI VersaProbe III system was supported by NSF-MRI Award #162601, MRI Acquisition of an X-ray Photoelectron Spectrometer for Chemical Mapping of Evolving Surfaces: A Regional Instrument for Research and Teaching. Thanks also to Dan Gopman for dicing the wafers at the NIST Center for Nanoscale Science and Technology. This research used the NIST Beamline for Materials Measurement of the National Synchrotron Light Source II, a U.S. Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Brookhaven National Laboratory under Contract No. DE-SC0012704. We thank Bruce Ravel for assistance in collecting the EXAFS data.
Keywords
- Combinatorial thin films
- Compositionally complex alloys
- EXAFS
- High throughput
- Multi-principal element alloys
- Passivity
- TEM
- XPS