An automated neutron reflectometer (POSY II) at the intense pulsed neutron source

Alamgir Karim; B. H. Arendt; Rick Goyette; Y. Y. Huang; R. Kleb; G. P. Felcher

doi:10.1016/0921-4526(91)90030-I

An automated neutron reflectometer (POSY II) at the intense pulsed neutron source

Alamgir Karim, B. H. Arendt, Rick Goyette, Y. Y. Huang, R. Kleb, G. P. Felcher

Argonne National Laboratory

Research output: Contribution to journal › Article › peer-review

28 Scopus citations

Abstract

A brief description is given of the time-of-flight neutron reflectometer POSY II at the Intense Pulsed Neutron Source (IPNS) at Argonne National Laboratory. Both data collection and refinement of the experimental data are nearly automatic. The neutron reflectivity is measured as a function of the neutron momentum perpendicular to the surface over a range from 0 to 0.1 Å^-1. The instrument is capable of measuring reflectivities as low as 10^-6. The neutron reflectivity is used to determine the composition profile of the layers close to the surface of the sample, with a depth resolution of {reversed tilde}10 Å.

Original language	English
Pages (from-to)	17-24
Number of pages	8
Journal	Physica B: Physics of Condensed Matter
Volume	173
Issue number	1-2
DOIs	https://doi.org/10.1016/0921-4526(91)90030-I
State	Published - Aug 1991
Externally published	Yes

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title = "An automated neutron reflectometer (POSY II) at the intense pulsed neutron source",

abstract = "A brief description is given of the time-of-flight neutron reflectometer POSY II at the Intense Pulsed Neutron Source (IPNS) at Argonne National Laboratory. Both data collection and refinement of the experimental data are nearly automatic. The neutron reflectivity is measured as a function of the neutron momentum perpendicular to the surface over a range from 0 to 0.1 {\AA}-1. The instrument is capable of measuring reflectivities as low as 10-6. The neutron reflectivity is used to determine the composition profile of the layers close to the surface of the sample, with a depth resolution of {reversed tilde}10 {\AA}.",

author = "Alamgir Karim and Arendt, {B. H.} and Rick Goyette and Huang, {Y. Y.} and R. Kleb and Felcher, {G. P.}",

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AU - Karim, Alamgir

AU - Arendt, B. H.

AU - Goyette, Rick

AU - Huang, Y. Y.

AU - Kleb, R.

AU - Felcher, G. P.

PY - 1991/8

Y1 - 1991/8

N2 - A brief description is given of the time-of-flight neutron reflectometer POSY II at the Intense Pulsed Neutron Source (IPNS) at Argonne National Laboratory. Both data collection and refinement of the experimental data are nearly automatic. The neutron reflectivity is measured as a function of the neutron momentum perpendicular to the surface over a range from 0 to 0.1 Å-1. The instrument is capable of measuring reflectivities as low as 10-6. The neutron reflectivity is used to determine the composition profile of the layers close to the surface of the sample, with a depth resolution of {reversed tilde}10 Å.

AB - A brief description is given of the time-of-flight neutron reflectometer POSY II at the Intense Pulsed Neutron Source (IPNS) at Argonne National Laboratory. Both data collection and refinement of the experimental data are nearly automatic. The neutron reflectivity is measured as a function of the neutron momentum perpendicular to the surface over a range from 0 to 0.1 Å-1. The instrument is capable of measuring reflectivities as low as 10-6. The neutron reflectivity is used to determine the composition profile of the layers close to the surface of the sample, with a depth resolution of {reversed tilde}10 Å.

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JO - Physica B: Physics of Condensed Matter

JF - Physica B: Physics of Condensed Matter

IS - 1-2

ER -

An automated neutron reflectometer (POSY II) at the intense pulsed neutron source

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