| Original language | English |
|---|---|
| Pages (from-to) | 91-92 |
| Number of pages | 2 |
| Journal | Scanning |
| Volume | 23 |
| Issue number | 2 |
| State | Published - 2001 |
An application of image retrieval technology to sidewall structure estimation from top-down scanning electron microscopy imagery
- K. W. Tobin
- , P. R. Bingham
- , J. R. Price
- , M. H. Bennett
Research output: Contribution to journal › Article › peer-review
1
Scopus
citations