An application of image retrieval technology to sidewall structure estimation from top-down scanning electron microscopy imagery

K. W. Tobin, P. R. Bingham, J. R. Price, M. H. Bennett

Research output: Contribution to journalArticlepeer-review

1 Scopus citations
Original languageEnglish
Pages (from-to)91-92
Number of pages2
JournalScanning
Volume23
Issue number2
StatePublished - 2001

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