Original language | English |
---|---|
Pages (from-to) | 91-92 |
Number of pages | 2 |
Journal | Scanning |
Volume | 23 |
Issue number | 2 |
State | Published - 2001 |
An application of image retrieval technology to sidewall structure estimation from top-down scanning electron microscopy imagery
K. W. Tobin, P. R. Bingham, J. R. Price, M. H. Bennett
Research output: Contribution to journal › Article › peer-review
1
Scopus
citations