An all-sputtered buffer layer architecture for high-Jc YBa2Cu3O7-δ coated conductors

T. Aytug; J. Z. Wu; B. W. Kang; D. T. Verebelyi; C. Cantoni; E. D. Specht; A. Goyal; M. Paranthaman; D. K. Christen

doi:10.1016/S0921-4534(00)01331-9

An all-sputtered buffer layer architecture for high-J_c YBa₂Cu₃O_7-δ coated conductors

T. Aytug
, J. Z. Wu
, B. W. Kang
, D. T. Verebelyi
, C. Cantoni
, E. D. Specht
, A. Goyal
, M. Paranthaman
, D. K. Christen

Nanomaterials Chemistry Group

Research output: Contribution to journal › Article › peer-review

12 Scopus citations

Abstract

We report the development of an all-sputter-deposited buffer multilayer architecture for the growth of high critical current density (J_c) YBa₂Cu₃O_7-δ (YBCO) films on metallic tapes. The structure comprises the layer sequence of CeO₂/YSZ/LNO (YSZ: yttria stabilized zirconia, LNO: LaNiO₃) on biaxially textured Ni substrates. X-ray diffraction analysis of the base LaNiO₃ (LNO) layers indicated that well textured films can be obtained at deposition temperatures (T_dep) between 450°C and 500°C, while higher T_dep yielded polycrystalline films. The degree of LNO crystallinity was also influenced by the oxygen partial pressure during the growth. Scanning electron microscopy observations revealed a smooth, dense and crack-free surface morphology, independent of film thickness in the range of 50-300 nm. Subsequent YSZ and CeO₂ films were deposited to complete the buffer-layer structure. Epitaxial YBCO films grown by pulsed laser ablation on the CeO₂/YSZ/LNO/Ni multilayer structure have self-field J_c values as high as 1.3 × 10⁶ A/cm² at 77 K. Effects of the LNO base-layer thickness on the quality of buffers and on the superconducting properties of YBCO films showed no remarkable differences. The present results demonstrate a viable approach for the production of long length YBCO superconducting wires.

Original language	English
Pages (from-to)	33-40
Number of pages	8
Journal	Physica C: Superconductivity and its Applications
Volume	340
Issue number	1
DOIs	https://doi.org/10.1016/S0921-4534(00)01331-9
State	Published - Nov 15 2000

Funding

Research was co-sponsored by the DOE Division of Materials Sciences, and by the DOE Office of Power Technologies, both under Contract No. DE-AC05-96OR22464 with Lockheed Martin Energy Research Corp. T. Aytug and J.Z. Wu would like to acknowledge NSF Grant No. DMR-9901460 and AFOSR Grant No. F49620-96-1-0358.

Keywords

Buffers layers
High-temperature superconductors
LaNiO
Sputtering
YBaCuO

Access to Document

10.1016/S0921-4534(00)01331-9

Cite this

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title = "An all-sputtered buffer layer architecture for high-Jc YBa2Cu3O7-δ coated conductors",

abstract = "We report the development of an all-sputter-deposited buffer multilayer architecture for the growth of high critical current density (Jc) YBa2Cu3O7-δ (YBCO) films on metallic tapes. The structure comprises the layer sequence of CeO2/YSZ/LNO (YSZ: yttria stabilized zirconia, LNO: LaNiO3) on biaxially textured Ni substrates. X-ray diffraction analysis of the base LaNiO3 (LNO) layers indicated that well textured films can be obtained at deposition temperatures (Tdep) between 450°C and 500°C, while higher Tdep yielded polycrystalline films. The degree of LNO crystallinity was also influenced by the oxygen partial pressure during the growth. Scanning electron microscopy observations revealed a smooth, dense and crack-free surface morphology, independent of film thickness in the range of 50-300 nm. Subsequent YSZ and CeO2 films were deposited to complete the buffer-layer structure. Epitaxial YBCO films grown by pulsed laser ablation on the CeO2/YSZ/LNO/Ni multilayer structure have self-field Jc values as high as 1.3 × 106 A/cm2 at 77 K. Effects of the LNO base-layer thickness on the quality of buffers and on the superconducting properties of YBCO films showed no remarkable differences. The present results demonstrate a viable approach for the production of long length YBCO superconducting wires.",

keywords = "Buffers layers, High-temperature superconductors, LaNiO, Sputtering, YBaCuO",

author = "T. Aytug and Wu, \{J. Z.\} and Kang, \{B. W.\} and Verebelyi, \{D. T.\} and C. Cantoni and Specht, \{E. D.\} and A. Goyal and M. Paranthaman and Christen, \{D. K.\}",

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T1 - An all-sputtered buffer layer architecture for high-Jc YBa2Cu3O7-δ coated conductors

AU - Aytug, T.

AU - Wu, J. Z.

AU - Kang, B. W.

AU - Verebelyi, D. T.

AU - Cantoni, C.

AU - Specht, E. D.

AU - Goyal, A.

AU - Paranthaman, M.

AU - Christen, D. K.

PY - 2000/11/15

Y1 - 2000/11/15

N2 - We report the development of an all-sputter-deposited buffer multilayer architecture for the growth of high critical current density (Jc) YBa2Cu3O7-δ (YBCO) films on metallic tapes. The structure comprises the layer sequence of CeO2/YSZ/LNO (YSZ: yttria stabilized zirconia, LNO: LaNiO3) on biaxially textured Ni substrates. X-ray diffraction analysis of the base LaNiO3 (LNO) layers indicated that well textured films can be obtained at deposition temperatures (Tdep) between 450°C and 500°C, while higher Tdep yielded polycrystalline films. The degree of LNO crystallinity was also influenced by the oxygen partial pressure during the growth. Scanning electron microscopy observations revealed a smooth, dense and crack-free surface morphology, independent of film thickness in the range of 50-300 nm. Subsequent YSZ and CeO2 films were deposited to complete the buffer-layer structure. Epitaxial YBCO films grown by pulsed laser ablation on the CeO2/YSZ/LNO/Ni multilayer structure have self-field Jc values as high as 1.3 × 106 A/cm2 at 77 K. Effects of the LNO base-layer thickness on the quality of buffers and on the superconducting properties of YBCO films showed no remarkable differences. The present results demonstrate a viable approach for the production of long length YBCO superconducting wires.

AB - We report the development of an all-sputter-deposited buffer multilayer architecture for the growth of high critical current density (Jc) YBa2Cu3O7-δ (YBCO) films on metallic tapes. The structure comprises the layer sequence of CeO2/YSZ/LNO (YSZ: yttria stabilized zirconia, LNO: LaNiO3) on biaxially textured Ni substrates. X-ray diffraction analysis of the base LaNiO3 (LNO) layers indicated that well textured films can be obtained at deposition temperatures (Tdep) between 450°C and 500°C, while higher Tdep yielded polycrystalline films. The degree of LNO crystallinity was also influenced by the oxygen partial pressure during the growth. Scanning electron microscopy observations revealed a smooth, dense and crack-free surface morphology, independent of film thickness in the range of 50-300 nm. Subsequent YSZ and CeO2 films were deposited to complete the buffer-layer structure. Epitaxial YBCO films grown by pulsed laser ablation on the CeO2/YSZ/LNO/Ni multilayer structure have self-field Jc values as high as 1.3 × 106 A/cm2 at 77 K. Effects of the LNO base-layer thickness on the quality of buffers and on the superconducting properties of YBCO films showed no remarkable differences. The present results demonstrate a viable approach for the production of long length YBCO superconducting wires.

KW - Buffers layers

KW - High-temperature superconductors

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