Aluminum hydroxide, bayerite, boehmite, and gibbsite ToF-SIMS spectra in the positive ion mode. II

Lyndi Strange, Yuchen Zhang, Jiyoung Son, Jun Gao, Vineet Joshi, Xiao Ying Yu

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was performed for boehmite (AOH-60) and its potential products of oxidation including pseudo-boehmite (AOH-180), α- and γ-Al2O3, and α- and γ-Al(OH)3. Since boehmite often forms on cladding materials to prevent corrosion, surface analysis techniques are performed to determine the amount of oxidation present. This ToF-SIMS spectral library is of significance because it includes boehmite and its potential oxidation products (i.e., aluminum oxide and hydroxide), which can be used to compare to spectra obtained for real-world samples containing boehmite. Furthermore, ToF-SIMS is often used as a complementary technique to x-ray photoelectron spectroscopy due to its surface sensitivity and ability to compare spectra via a multivariate analysis, therefore establishing that the molecular signatures of boehmite and relevant compounds are essential for peak identification. The SIMS spectra shown are acquired from commercially available powders, which were deposited onto a silicon wafer substrate via liquid slurry drop casting. This library of SIMS mass spectra will serve as a comparison of boehmite [γ-AlO(OH)], pseudo-boehmite [AlOOH·nH2O], α- and γ-Al2O3 aluminum oxide, and α- and γ-Al2O3 aluminum hydroxide in the positive ion mode, which compliments those reported in the negative ion mode {Part I [L. Strange et al., Surf. Sci. Spectra 29(2), 025001 (2022)]}.

Original languageEnglish
Article number025002
JournalSurface Science Spectra
Volume29
Issue number2
DOIs
StatePublished - Dec 1 2022
Externally publishedYes

Funding

This work was supported by the U.S. Department of Energy (DOE) National Nuclear Security Administration for the Office of Materials Management and Minimization (M3). Pacific Northwest National Laboratory (PNNL) is operated for the U.S. DOE by Battelle Memorial Institute under Contract No. DE-AC05-76RL01830. The authors also appreciate Nabeltec and Sasol Organics for providing samples for this work. The manuscript preparation for X.-Y. Yu was supported partially by the strategic Laboratory Directed Research and Development (LDRD) of the Physical Sciences Directorate of the Oak Ridge National Laboratory (ORNL). ORNL is managed by UT-Battelle, LLC, for the U. S. Department of Energy (DOE) under Contract No. DE-AC05-00OR22725.

Fingerprint

Dive into the research topics of 'Aluminum hydroxide, bayerite, boehmite, and gibbsite ToF-SIMS spectra in the positive ion mode. II'. Together they form a unique fingerprint.

Cite this