All-dielectric metasurface analogue of electromagnetically induced transparency

Yuanmu Yang, Ivan I. Kravchenko, Dayrl P. Briggs, Jason Valentine

Research output: Contribution to journalArticlepeer-review

961 Scopus citations

Abstract

Metasurface analogues of electromagnetically induced transparency (EIT) have been a focus of the nanophotonics field in recent years, due to their ability to produce high-quality factor (Q-factor) resonances. Such resonances are expected to be useful for applications such as low-loss slow-light devices and highly sensitive optical sensors. However, ohmic losses limit the achievable Q-factors in conventional plasmonic EIT metasurfaces to values <∼10, significantly hampering device performance. Here we experimentally demonstrate a classical analogue of EIT using all-dielectric silicon-based metasurfaces. Due to extremely low absorption loss and coherent interaction of neighbouring meta-atoms, a Q-factor of 483 is observed, leading to a refractive index sensor with a figure-of-merit of 103. Furthermore, we show that the dielectric metasurfaces can be engineered to confine the optical field in either the silicon resonator or the environment, allowing one to tailor light-matter interaction at the nanoscale.

Original languageEnglish
Article number5753
JournalNature Communications
Volume5
DOIs
StatePublished - Dec 2014

Funding

This work was funded by the Office of Naval Research under programmes N00014-12-1-0571 and N00014-14-1-0475. A portion of this research was conducted at the Center for Nanophase Materials Sciences, which is sponsored at Oak Ridge National Laboratory by the Scientific User Facilities Division, Office of Basic Energy Sciences, US Department of Energy. A portion of this work was also performed at the Vanderbilt Institute of Nanoscale Science and Engineering, we thank the staff for their support.

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