Advances in total scattering analysis

Thomas Proffen, Hyunjeong Kim

Research output: Contribution to journalArticlepeer-review

56 Scopus citations

Abstract

In recent years the analysis of the total scattering pattern has become an invaluable tool to study disordered crystalline and nanocrystalline materials. Traditional crystallographic structure determination is based on Bragg intensities and yields the long range average atomic structure. By including diffuse scattering into the analysis, the local and medium range atomic structure can be unravelled. Here we give an overview of recent experimental advances, using X-rays as well as neutron scattering as well as current trends in modelling of total scattering data.

Original languageEnglish
Pages (from-to)5078-5088
Number of pages11
JournalJournal of Materials Chemistry
Volume19
Issue number29
DOIs
StatePublished - Aug 7 2009
Externally publishedYes

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