Abstract
Aberration correction has recently made the transition from being merely a technically interesting result to finally becoming a practical tool for extremely high resolution electron microscopy. In this paper we discuss some of the progress that is being made and highlight some of the more unexpected advantages that aberration correction will bring.
Original language | English |
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Pages (from-to) | 211-214 |
Number of pages | 4 |
Journal | Institute of Physics Conference Series |
Volume | 179 |
State | Published - 2004 |
Event | Electron Microscopy and Analysis 2003 - Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference - Oxford, United Kingdom Duration: Sep 3 2003 → Sep 5 2003 |