Advances in aberration corrected STEM at ORNL

A. R. Lupini, M. Varela, A. Y. Borisevich, S. M. Travaglini, S. J. Pennycook

Research output: Contribution to journalConference articlepeer-review

2 Scopus citations

Abstract

Aberration correction has recently made the transition from being merely a technically interesting result to finally becoming a practical tool for extremely high resolution electron microscopy. In this paper we discuss some of the progress that is being made and highlight some of the more unexpected advantages that aberration correction will bring.

Original languageEnglish
Pages (from-to)211-214
Number of pages4
JournalInstitute of Physics Conference Series
Volume179
StatePublished - 2004
EventElectron Microscopy and Analysis 2003 - Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference - Oxford, United Kingdom
Duration: Sep 3 2003Sep 5 2003

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