Advanced focusing system for secondary electrons in a bunch shape monitor

S. V. Kutsaev; R. Agustsson; A. Aleksandrov; O. Adonyev; A. Moro; K. Taletski

doi:10.1016/j.nima.2021.165846

Advanced focusing system for secondary electrons in a bunch shape monitor

S. V. Kutsaev, R. Agustsson, A. Aleksandrov, O. Adonyev, A. Moro, K. Taletski

Beam Instrumentation

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2 Scopus citations

Abstract

Measurements of longitudinal beam profile in non-relativistic hadron accelerators are usually performed with Bunch Shape Monitors that utilize secondary electron emission to reproduce the shape of a primary ion beam. The existing devices, however, have poor electron collection efficiency from the wire and are limited to one dimensional measurements of the phase coordinate. In this paper we present the performance improvements for a bunch shape monitor for proton beams used in the Spallation Neutron Source accelerator. These improvements were achieved by adding focusing optics between the wire and the entrance slit, which will also allow measurements over a much higher dynamic range. Here we present the design, simulation and experimental test results of the developed new electron beam guidance system for the existing SNS bunch shape monitor that allowed significant improvement in the collection efficiency.

Original language	English
Article number	165846
Journal	Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume	1019
DOIs	https://doi.org/10.1016/j.nima.2021.165846
State	Published - Dec 11 2021

Funding

This work was supported by the U.S. Department of Energy , Office of Basic Energy Sciences, under contract DE-SC0020590 . ORNL is managed by UT-Battelle, LLC, under contract DE-AC05-00OR22725 for the U.S. Department of Energy .

Funders	Funder number
U.S. Department of Energy
Basic Energy Sciences	DE-SC0020590
Oak Ridge National Laboratory	DE-AC05-00OR22725

Keywords

Beam shape monitor
Electron collection system
Electron optics
Proton beam
SNS
Secondary emission

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10.1016/j.nima.2021.165846

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title = "Advanced focusing system for secondary electrons in a bunch shape monitor",

abstract = "Measurements of longitudinal beam profile in non-relativistic hadron accelerators are usually performed with Bunch Shape Monitors that utilize secondary electron emission to reproduce the shape of a primary ion beam. The existing devices, however, have poor electron collection efficiency from the wire and are limited to one dimensional measurements of the phase coordinate. In this paper we present the performance improvements for a bunch shape monitor for proton beams used in the Spallation Neutron Source accelerator. These improvements were achieved by adding focusing optics between the wire and the entrance slit, which will also allow measurements over a much higher dynamic range. Here we present the design, simulation and experimental test results of the developed new electron beam guidance system for the existing SNS bunch shape monitor that allowed significant improvement in the collection efficiency.",

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AU - Kutsaev, S. V.

AU - Agustsson, R.

AU - Aleksandrov, A.

AU - Adonyev, O.

AU - Moro, A.

AU - Taletski, K.

PY - 2021/12/11

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N2 - Measurements of longitudinal beam profile in non-relativistic hadron accelerators are usually performed with Bunch Shape Monitors that utilize secondary electron emission to reproduce the shape of a primary ion beam. The existing devices, however, have poor electron collection efficiency from the wire and are limited to one dimensional measurements of the phase coordinate. In this paper we present the performance improvements for a bunch shape monitor for proton beams used in the Spallation Neutron Source accelerator. These improvements were achieved by adding focusing optics between the wire and the entrance slit, which will also allow measurements over a much higher dynamic range. Here we present the design, simulation and experimental test results of the developed new electron beam guidance system for the existing SNS bunch shape monitor that allowed significant improvement in the collection efficiency.

AB - Measurements of longitudinal beam profile in non-relativistic hadron accelerators are usually performed with Bunch Shape Monitors that utilize secondary electron emission to reproduce the shape of a primary ion beam. The existing devices, however, have poor electron collection efficiency from the wire and are limited to one dimensional measurements of the phase coordinate. In this paper we present the performance improvements for a bunch shape monitor for proton beams used in the Spallation Neutron Source accelerator. These improvements were achieved by adding focusing optics between the wire and the entrance slit, which will also allow measurements over a much higher dynamic range. Here we present the design, simulation and experimental test results of the developed new electron beam guidance system for the existing SNS bunch shape monitor that allowed significant improvement in the collection efficiency.

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KW - Electron collection system

KW - Electron optics

KW - Proton beam

KW - SNS

KW - Secondary emission

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Advanced focusing system for secondary electrons in a bunch shape monitor

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