Abstract
Off-acis electron holography was used to characterize the structure and morphology of nanometer-sized particles of palladium. The particles were found to be hollow and partially facetted on internal as well as external surfaces. In theoretical developments, the extended Fourier transform (EFT) is discussed and its necessity for true centering of the sideband in electron holography is shown. A reconstruction procedure for off-axis holograms is then proposed using the advantages of the EFT method. Finally, a standard criterion for assessing the effectiveness of a field emission electron microscope for use in electron holography is proposed and illustrated.
| Original language | English |
|---|---|
| Pages (from-to) | 97-103 |
| Number of pages | 7 |
| Journal | Ultramicroscopy |
| Volume | 58 |
| Issue number | 1 |
| DOIs | |
| State | Published - Apr 1995 |
Funding
This work was supported by the Directed R & D Program of Oak Ridge National Laboratory, managed for the DOE by Martin Marietta Energy Systems, Inc., under contract DE-AC05-84OR21400 and supported in part by an appointment to the Oak Ridge National Laboratory Postdoctoral Research Program administered by the Oak Ridge Institute for Science and Education. We want to thank M.R. McCartney for discussions on the standard test and F. Lenz for discussion on the EFT.
| Funders | Funder number |
|---|---|
| U.S. Department of Energy | DE-AC05-84OR21400 |
| Oak Ridge National Laboratory | |
| Oak Ridge Institute for Science and Education |