Abstract
Scanning tunneling microscopy (STM) and synchrotron photoemission were used to analyze the Sb/Si(001) interface formation for submonolayer and saturation coverages. The surface-shifted core-level component observed in photoemission for Si(001)-(2×1) was suppressed with the adsorption of Sb. Constant-current STM images which were taken for different sample bias conditions show changes in the spatial distribution of the occupied and unoccupied states derived from the Si-dimer dangling bonds upon Sb adsorption. These observations are interpreted in terms of the formation of Sb-Si bonds and the resulting modifications in the surface electronic properties.
| Original language | English |
|---|---|
| Pages (from-to) | 12758-12763 |
| Number of pages | 6 |
| Journal | Physical Review B |
| Volume | 39 |
| Issue number | 17 |
| DOIs | |
| State | Published - 1989 |
| Externally published | Yes |