Abstract
A novel addressable field emission array (AFEA) for use in new deep sub-micron electron-beam lithography system is developed. The device consists of a low electron affinity coating deposited on aluminum biasing pads controlled by CMOS circuitry. Each cathode is individually addressable, providing a matrix of massively parallel but independent electron beams. The CMOS circuitry will address and control cathodes, providing dynamic control of the e-beam matrix.
| Original language | English |
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| Pages | 178-179 |
| Number of pages | 2 |
| State | Published - 1998 |
| Event | Proceedings of the 1998 11th International Vacuum Microelectronics Conference, IVMC - Asheville, NC, USA Duration: Jul 19 1998 → Jul 24 1998 |
Conference
| Conference | Proceedings of the 1998 11th International Vacuum Microelectronics Conference, IVMC |
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| City | Asheville, NC, USA |
| Period | 07/19/98 → 07/24/98 |