Addressable field emission array for E-beam lithography using planar, pulsed-laser deposited amorphous diamond cathodes

Vladimir I. Merkulov, Douglas H. Lowndes, L. R. Baylor, A. A. Puretzky, G. E. Jellison, D. B. Geohegan, M. J. Paulus, C. E. Thomas, M. L. Simpson, J. A. Moore, E. Voelkl

Research output: Contribution to conferencePaperpeer-review

7 Scopus citations

Abstract

A novel addressable field emission array (AFEA) for use in new deep sub-micron electron-beam lithography system is developed. The device consists of a low electron affinity coating deposited on aluminum biasing pads controlled by CMOS circuitry. Each cathode is individually addressable, providing a matrix of massively parallel but independent electron beams. The CMOS circuitry will address and control cathodes, providing dynamic control of the e-beam matrix.

Original languageEnglish
Pages178-179
Number of pages2
StatePublished - 1998
EventProceedings of the 1998 11th International Vacuum Microelectronics Conference, IVMC - Asheville, NC, USA
Duration: Jul 19 1998Jul 24 1998

Conference

ConferenceProceedings of the 1998 11th International Vacuum Microelectronics Conference, IVMC
CityAsheville, NC, USA
Period07/19/9807/24/98

Fingerprint

Dive into the research topics of 'Addressable field emission array for E-beam lithography using planar, pulsed-laser deposited amorphous diamond cathodes'. Together they form a unique fingerprint.

Cite this