Adaptive atomic force microscope

Patrick D. Schmidt; Benjamin H. Reichert; John G. Lajoie; Sanjeevi Sivasankar

doi:10.1117/12.2545261

Adaptive atomic force microscope

Patrick D. Schmidt, Benjamin H. Reichert, John G. Lajoie, Sanjeevi Sivasankar

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

Commercial atomic force microscope (AFM) solutions do not typically lend themselves to easy integration into a wide range of optical microscope platforms. Here we present a custom AFM platform which is readily integrated into an FPGA controlled fluorescence microscope and is easily programmed for a variety of unique applications. Our collimated laser design allows for an adjustable sensitivity depending on the range of forces required, and the large range piezo (100μm in all three dimensions) presents the freedom to perform precise measurement and manipulation in a high throughput manner, over a broad range of distances. We demonstrate a high bandwidth of 1MHz with low noise levels of less than 71pN at full bandwidth and below 6pN at a relevant bandwidth of 1kHz.

Original language	English
Title of host publication	Single Molecule Spectroscopy and Superresolution Imaging XIII
Editors	Ingo Gregor, Felix Koberling, Rainer Erdmann
Publisher	SPIE
ISBN (Electronic)	9781510632554
DOIs	https://doi.org/10.1117/12.2545261
State	Published - 2020
Externally published	Yes
Event	Single Molecule Spectroscopy and Superresolution Imaging XIII 2020 - San Francisco, United States Duration: Feb 1 2020 → Feb 2 2020

Publication series

Name	Progress in Biomedical Optics and Imaging - Proceedings of SPIE
Volume	11246
ISSN (Print)	1605-7422

Conference

Conference	Single Molecule Spectroscopy and Superresolution Imaging XIII 2020
Country/Territory	United States
City	San Francisco
Period	02/1/20 → 02/2/20

Funding

Research reported in this publication was supported in part by the National Institute of General Medical Sciences of the National Institutes of Health (R01GM121885). We acknowledge machining and 3D printing assistance from UC Davis TEAM Laboratories, team.ucdavis.edu.

Keywords

AFM
Adjustable Sensitivity
Atomic Force Microscope
Cell Probe
High Bandwidth
Large Range
Manipulation
Single Molecule

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10.1117/12.2545261

Cite this

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title = "Adaptive atomic force microscope",

abstract = "Commercial atomic force microscope (AFM) solutions do not typically lend themselves to easy integration into a wide range of optical microscope platforms. Here we present a custom AFM platform which is readily integrated into an FPGA controlled fluorescence microscope and is easily programmed for a variety of unique applications. Our collimated laser design allows for an adjustable sensitivity depending on the range of forces required, and the large range piezo (100μm in all three dimensions) presents the freedom to perform precise measurement and manipulation in a high throughput manner, over a broad range of distances. We demonstrate a high bandwidth of 1MHz with low noise levels of less than 71pN at full bandwidth and below 6pN at a relevant bandwidth of 1kHz.",

keywords = "AFM, Adjustable Sensitivity, Atomic Force Microscope, Cell Probe, High Bandwidth, Large Range, Manipulation, Single Molecule",

author = "Schmidt, {Patrick D.} and Reichert, {Benjamin H.} and Lajoie, {John G.} and Sanjeevi Sivasankar",

note = "Publisher Copyright: {\textcopyright} COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.; Single Molecule Spectroscopy and Superresolution Imaging XIII 2020 ; Conference date: 01-02-2020 Through 02-02-2020",

year = "2020",

doi = "10.1117/12.2545261",

language = "English",

series = "Progress in Biomedical Optics and Imaging - Proceedings of SPIE",

publisher = "SPIE",

editor = "Ingo Gregor and Felix Koberling and Rainer Erdmann",

booktitle = "Single Molecule Spectroscopy and Superresolution Imaging XIII",

}

Schmidt, PD, Reichert, BH, Lajoie, JG & Sivasankar, S 2020, Adaptive atomic force microscope. in I Gregor, F Koberling & R Erdmann (eds), Single Molecule Spectroscopy and Superresolution Imaging XIII., 1124604, Progress in Biomedical Optics and Imaging - Proceedings of SPIE, vol. 11246, SPIE, Single Molecule Spectroscopy and Superresolution Imaging XIII 2020, San Francisco, United States, 02/1/20. https://doi.org/10.1117/12.2545261

Adaptive atomic force microscope. / Schmidt, Patrick D.; Reichert, Benjamin H.; Lajoie, John G. et al.
Single Molecule Spectroscopy and Superresolution Imaging XIII. ed. / Ingo Gregor; Felix Koberling; Rainer Erdmann. SPIE, 2020. 1124604 (Progress in Biomedical Optics and Imaging - Proceedings of SPIE; Vol. 11246).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Lajoie, John G.

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PY - 2020

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N2 - Commercial atomic force microscope (AFM) solutions do not typically lend themselves to easy integration into a wide range of optical microscope platforms. Here we present a custom AFM platform which is readily integrated into an FPGA controlled fluorescence microscope and is easily programmed for a variety of unique applications. Our collimated laser design allows for an adjustable sensitivity depending on the range of forces required, and the large range piezo (100μm in all three dimensions) presents the freedom to perform precise measurement and manipulation in a high throughput manner, over a broad range of distances. We demonstrate a high bandwidth of 1MHz with low noise levels of less than 71pN at full bandwidth and below 6pN at a relevant bandwidth of 1kHz.

AB - Commercial atomic force microscope (AFM) solutions do not typically lend themselves to easy integration into a wide range of optical microscope platforms. Here we present a custom AFM platform which is readily integrated into an FPGA controlled fluorescence microscope and is easily programmed for a variety of unique applications. Our collimated laser design allows for an adjustable sensitivity depending on the range of forces required, and the large range piezo (100μm in all three dimensions) presents the freedom to perform precise measurement and manipulation in a high throughput manner, over a broad range of distances. We demonstrate a high bandwidth of 1MHz with low noise levels of less than 71pN at full bandwidth and below 6pN at a relevant bandwidth of 1kHz.

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KW - Manipulation

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Adaptive atomic force microscope

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