Accelerating Scientific Simulations with Bi-Fidelity Weighted Transfer Learning

Katarzyna Borowiec, Dan Lu, Vikas Chandan, Samrat Chatterjee, Pradeep Ramuhalli, Ramakrishna Tipireddy, Mahantesh Halappanavar, Frank Liu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

High-fidelity modeling is an essential design tool for many engineering applications. However, for complex systems, computational cost can be a limiting factor. Analyzing parameter sensitivity, uncertainty quantification, and design optimization require many model evaluations. Surrogate models are often used to develop the relationship between model parameters and quantities of interest. However, in the case of complex systems, surrogate models require several degrees of freedom and, thus, a large number of data points to determine the correct dependencies. For many applications, this may be prohibitively expensive. The reduction of computational requirements can be achieved by leveraging low-fidelity models. Low-fidelity models represent the system at a coarser resolution with the advantage of computational efficiency. Therefore, a bi-fidelity modeling paradigm, which augments the accuracy of a low-fidelity model in a computationally efficient manner by invoking limited runs of a high-fidelity model, can be leveraged to sufficiently balance the accuracy and computational requirements. In this work, a bi-fidelity weighted transfer learning method using neural networks was applied to a computational fluid dynamics heat transfer modeling problem. The transfer learning advantage was investigated as a function of hyperparameters. Our main finding is that the use of a bi-fidelity modeling paradigm achieves accuracy close to that of a high-fidelity Gaussian process model while significantly reducing computational cost.

Original languageEnglish
Title of host publicationProceedings - 22nd IEEE International Conference on Machine Learning and Applications, ICMLA 2023
EditorsM. Arif Wani, Mihai Boicu, Moamar Sayed-Mouchaweh, Pedro Henriques Abreu, Joao Gama
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages994-999
Number of pages6
ISBN (Electronic)9798350345346
DOIs
StatePublished - 2023
Event22nd IEEE International Conference on Machine Learning and Applications, ICMLA 2023 - Jacksonville, United States
Duration: Dec 15 2023Dec 17 2023

Publication series

NameProceedings - 22nd IEEE International Conference on Machine Learning and Applications, ICMLA 2023

Conference

Conference22nd IEEE International Conference on Machine Learning and Applications, ICMLA 2023
Country/TerritoryUnited States
CityJacksonville
Period12/15/2312/17/23

Keywords

  • bi-fidelity modeling
  • surrogate modeling
  • transfer learning

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