Absorption Enhancement by Ni-Silicide Nanostructures Embedded in Ultra-Thin Si Films

R. Sachan; C. M. Gonzalez; O. Dyck; P. D. Rack; H. Garcia; G. Duscher; R. Kalyanaraman

doi:10.1017/S1431927612011166

Absorption Enhancement by Ni-Silicide Nanostructures Embedded in Ultra-Thin Si Films

R. Sachan, C. M. Gonzalez, O. Dyck, P. D. Rack, H. Garcia, G. Duscher, R. Kalyanaraman

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1862-1863
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	18
Issue number	S2
DOIs	https://doi.org/10.1017/S1431927612011166
State	Published - Jul 2012
Externally published	Yes

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title = "Absorption Enhancement by Ni-Silicide Nanostructures Embedded in Ultra-Thin Si Films",

author = "R. Sachan and Gonzalez, \{C. M.\} and O. Dyck and Rack, \{P. D.\} and H. Garcia and G. Duscher and R. Kalyanaraman",

year = "2012",

month = jul,

doi = "10.1017/S1431927612011166",

language = "English",

volume = "18",

pages = "1862--1863",

journal = "Microscopy and Microanalysis",

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T1 - Absorption Enhancement by Ni-Silicide Nanostructures Embedded in Ultra-Thin Si Films

AU - Sachan, R.

AU - Gonzalez, C. M.

AU - Dyck, O.

AU - Rack, P. D.

AU - Garcia, H.

AU - Duscher, G.

AU - Kalyanaraman, R.

PY - 2012/7

Y1 - 2012/7

UR - https://www.scopus.com/pages/publications/85008550179

U2 - 10.1017/S1431927612011166

DO - 10.1017/S1431927612011166

M3 - Article

AN - SCOPUS:85008550179

SN - 1431-9276

VL - 18

SP - 1862

EP - 1863

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S2

ER -

Absorption Enhancement by Ni-Silicide Nanostructures Embedded in Ultra-Thin Si Films

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