Aberration-corrected STEM - More than just higher resolution

S. J. Pennycook, M. F. Chisholm, A. R. Lupini, Y. Peng, M. Varela, K. Van Benthem, A. Borisevich, N. De Jonge, M. P. Oxley

Research output: Contribution to journalArticlepeer-review

1 Scopus citations
Original languageEnglish
Pages (from-to)132-133
Number of pages2
JournalMicroscopy and Microanalysis
Volume12
Issue numberSUPPL. 2
DOIs
StatePublished - Aug 2006

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