Original language | English |
---|---|
Pages (from-to) | 132-133 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 12 |
Issue number | SUPPL. 2 |
DOIs | |
State | Published - Aug 2006 |
Aberration-corrected STEM - More than just higher resolution
S. J. Pennycook, M. F. Chisholm, A. R. Lupini, Y. Peng, M. Varela, K. Van Benthem, A. Borisevich, N. De Jonge, M. P. Oxley
Research output: Contribution to journal › Article › peer-review
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